Ellisys has announced collaborations with leading test & measurement providers Agilent Technologies and Tektronix Inc. Ellisys will work with these two companies to extend their respective physical layer test and compliance solutions for SuperSpeed USB, including loopback mode receiver testing. These additional capabilities will be provided by special-purpose configurations of the Ellisys Explorer 280 (EX280) SuperSpeed USB 3.0 protocol analyzer/generator system. SuperSpeed USB, employing a 5Gb/second signaling rate, is the latest version of the ubiquitous USB personal interconnect, targeted at applications involving rich media, storage, and large digital transfers.
To extend test capabilities, Ellisys will provide versions of its SuperSpeed USB Explorer 280 for purposes of characterizing the bit error rate (BER) in the retransmitted bit streams. Test equipment provided by Tektronix or Agilent can be used to precisely control a multitude of complex physical parameters of the signal transmitted to the receiver in order to test various aspects of the receiver's capabilities, which are then characterized by the Ellisys EX280 system.
